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・ Textual criticism
・ Textual Criticism and Qur’ān Manuscripts
・ Textual criticism of the New Testament
・ Textual entailment
・ Textual Practice
・ Textual scholarship
・ Textual variants in the Gospel of Matthew
・ Textual variants in the New Testament
・ Textualism
・ Textuality
・ Textularia
・ Textulariacea
・ Textulariida
・ Texture
・ Texture (cosmology)
Texture (crystalline)
・ Texture (geology)
・ Texture (music)
・ Texture (painting)
・ Texture (roads)
・ Texture (visual arts)
・ Texture advection
・ Texture artist
・ Texture atlas
・ Texture compression
・ Texture Discrimination Task
・ Texture filtering
・ Texture gradient
・ Texture mapping
・ Texture mapping unit


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Texture (crystalline) : ウィキペディア英語版
Texture (crystalline)

In materials science, texture is the distribution of crystallographic orientations of a polycrystalline sample. A sample in which these orientations are fully random is said to have no distinct texture. If the crystallographic orientations are not random, but have some preferred orientation, then the sample has a weak, moderate or strong texture. The degree is dependent on the percentage of crystals having the preferred orientation. Texture is seen in almost all engineered materials, and can have a great influence on materials properties. Also, geologic rocks show texture due to their thermo-mechanic history of formation processes.
One extreme case is a complete lack of texture: a solid with perfectly random crystallite orientation will have isotropic properties at length scales sufficiently larger than the size of the crystallites. The opposite extreme is a perfect single crystal, which has anisotropic properties by geometric necessity.
==Characterization and representation==
Texture can be determined by various methods. Some methods allow a quantitative analysis of the texture, while others are only qualitative. Among the quantitative techniques, the most widely used is X-ray diffraction using texture goniometers, followed by the EBSD method (electron backscatter diffraction) in Scanning Electron Microscopes. Qualitative analysis can be done by Laue photography, simple X-ray diffraction or with a polarized microscope. Neutron and synchrotron high-energy X-ray diffraction are suitable for determining textures of bulk materials and in situ analysis, whereas laboratory x-ray diffraction instruments are more appropriate for analyzing textures of thin films.
Texture is often represented using a pole figure, in which a specified crystallographic axis (or pole) from each of a representative number of crystallites is plotted in a stereographic projection, along with directions relevant to the material's processing history. These directions define the so-called sample reference frame and are, because the investigation of textures started from the cold working of metals, usually referred to as the rolling direction ''RD'', the transverse direction ''TD'' and the normal direction ''ND''. For drawn metal wires the cylindrical fiber axis turned out as the sample direction around which preferred orientation is typically observed (see below).

Image:Diffractometre berceau Euler.png|Four circles diffractometer, or Eulerian cradle, for texture measurement with X-ray diffraction
Image:Diffractometre montage chi reflexion.png|χ mode for reflection measurement
Image:Diffractometre montage omega transmission.png|Ω mode for transmission measurement


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